National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
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High Resolution Electron Microscopy


Thin crystal films of fullerene (C60) molecules were fabricated by using an organic molecular beam deposition (OMBD) technique in a high vacuum and were observed by using a high-resolution electron microscope to analyze their formation mechanism. The nucleation and successive crystal growth on the surface of solid substrate were controlled in an optimized condition. An electron micrograph revealed global molecules appearing as black dots with diameters of 0.8nm, and confirmed the successful fabrication of high-quality thin films with a crystal region extending to the order of several µm. The world in atomic and molecular scale has been opened to us in recent years by high resolution electron microscope combined with micro-analysis techniques.


High-resolution electron micrograph of C60 thin film CThe point in the photo corresponds to a fullerene molecule.)


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