National Institute of Advanced Industrial Science and Technology (AIST) This page is a page of the former research institute. We stopped updating on March 31.2001.
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Surface Analysis by Synchrotron Radiation

Compared with conventional light sources, an extremely strong (1O4-106) light beam can be created by using synchrotron radiation. We utilize synchrotron radiation to obtain high-intensity, high-resolution soft x-ray beams. These beams are used as probes and are played onto substance or adsorbate surfaces. By detecting the resulting electrons, ions, and other particles emitted, we aim to develop new technology for analyzing surface structures and functions.

In our studies, we use the high-intensity, high-resolution soft x-ray beam lines as well as the systems of analysis and evaluation connected with the synchrotron radiation facilities that the Institute has developed in cooperation with the High Energy Physics Research Institute.

If new surface analysis and control technology is established through our studies, much more data are expected to be gained on the relationship between surface structures and surface functions of substances. It may become possible to design new surface functional materials such as new catalysts with remarkably higher activity than conventional ones.

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