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Observation of Diamond Crystallites in Thin Films Prepared by Laser Ablation of Hard Fullerene-Based Carbon

M. E. Kozlov, K. Yase, N. Minami, P. Fons, H. -A. Durand,
A. N. Obraztsov, K. Nozaki, and M. Tokumoto
[J. Phys. D: Appl. Phys., Vol. 29, pp. 929-933, 1996]

Thin carbon films have been prepared by ArF excimer laser ablation of hard fullerene-based carbon in vacuum. The target material was obtained from a pressure-temperature treatment of C60 fullerene. Micro-Raman, electron energy loss and electron diffraction measurements of deposited films reveal distinct evidence of microcrystalline diamond. Appearance of the diamond fraction in the films can be related to a peculiar structure of the target substance.

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